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碲化錫 Sb2Te3

簡要描述:Powder X-ray diffraction (XRD) of a single crystal Sb2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

  • 更新時間:2024-06-03
  • 產品型號:
  • 廠商性質:生產廠家
  • 訪  問  量:882

詳細介紹

晶體尺寸:10毫米
電學性能:半導體,拓撲絕緣體,熱電性
晶體結構:六邊形
晶胞參數:a = b = 0.425nm,C = 3.048nm,α=β= 90°γ= 120
晶體類型:合成
晶體純度:>99.995%
表征方法:XRD、拉曼、EDX


X-ray diffraction on a Sb2Te3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 7 XRD peaks correspond, from left to right, to (00l) with l = 6, 9, 12, 15, 18, 21, 24



Powder X-ray diffraction (XRD) of a single crystal Sb2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Stoichiometric analysis of a single crystal Sb2Te3 by Energy-dispersive X-ray spectroscopy (EDX).


Raman spectrum of a single crystal Sb2Te3. Measurement was performed with a 785 nm Raman system at room temperature.


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